Dynamic bias for a quicker LDO
Low-dropout regulators are not exactly synonymous with ultralow power operation – their linear behaviour is effectively paid for with lower overall efficiency, especially if they need to be able to...
View ArticleChip test without the unplanned burn-in
Low-power design and fast testing at the fab are not happy bedfellows. As Giri Podichetty of Mentor Graphics explains at Semiwiki and in a white paper, “the goal of automatic test pattern generation...
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